Behavioral synthesis for easy testability in data path scheduling

A data path scheduling algorithm to improve testability without assuming any particular test strategy is presented. A scheduling heuristic for easy testability, based on previous work on data path allocation for testability, is introduced. A mobility path scheduling algorithm to implement this heuristic while also minimizing area is developed. Experimental results on benchmark and example circuits show high fault coverage, short test generation time, and little or no area overhead.<<ETX>>

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