A Probabilistic Logic for Nanoscale Devices

A logic with probabilistic characterization is suitable for expressing the states of nanoscale devices. This paper describes a novel method of calculating probability distribution of nano gate states. It is based on the Markov random field theory with new features, such as clique potential, probability density of initial nodes. We demonstrate the effectiveness of the method by basic gates and circuits. The analysis shows that the device probability distribution highly depends on the system structures and temperature parameters.