Normal-incidence reflectance difference spectroscopy based on a liquid crystal variable retarder.

We propose liquid crystal variable retarder-based reflectance difference spectroscopy for normal-incidence measurements. Principles, instrumentation, data collection and reduction, and calibration procedures are provided. The signal noise is better than 10-3, and the spectral range is from 1.6 to 2.4 eV with 346 photon energy channels. As a demonstration, reflectance difference signals of a multilayer pentacene film on poly (ethylene terephthalate) (PET) film are presented with different polarization azimuths. The characteristic peaks at 1.8 and 1.97 eV, corresponding to the Davydov splitting of pentacene crystal, are observed, which indicate well-ordered in-plane anisotropic structure of pentacene crystal film on PET. Thanks to normal incidence, this design is immune to adjusting the optical structure for the measurements with different working distances, and the objective lens is easily integrated to realize microarea measurements.

[1]  A. Davydov THE THEORY OF MOLECULAR EXCITONS , 1964 .

[2]  R. Azzam Perpendicular-incidence photometric ellipsometry (PIPE) of surfaces with arbitrary anisotropy , 1981 .

[3]  Aspnes,et al.  Anisotropies in the above-bandgap optical spectra of cubic semiconductors. , 1985, Physical review letters.

[4]  J. P. Harbison,et al.  Application of reflectance difference spectroscopy to molecular‐beam epitaxy growth of GaAs and AlAs , 1988 .

[5]  A. A. Studna,et al.  Reflectance‐difference spectroscopy system for real‐time measurements of crystal growth , 1988 .

[6]  O. Acher,et al.  A reflectance anisotropy spectrometer for real‐time measurements , 1992 .

[7]  L. F. Lastras-Martínez,et al.  A spectrometer for the measurement of reflectance‐difference spectra , 1993 .

[8]  L. Florez,et al.  Relationship among reflectance‐difference spectroscopy, surface photoabsorption, and spectroellipsometry , 1993 .

[9]  G. Ertl,et al.  Imaging Pattern Formation in Surface Reactions from Ultrahigh Vacuum up to Atmospheric Pressures , 1995, Science.

[10]  M. Cardona,et al.  MICROSCOPIC REFLECTION DIFFERENCE SPECTROSCOPY ON SEMICONDUCTOR NANOSTRUCTURES , 1998 .

[11]  Peter Weightman,et al.  Reflection anisotropy spectroscopy , 2005 .

[12]  Juan M. Bueno,et al.  Polarimetry using liquid-crystal variable retarders : theory and calibration , 2000 .

[13]  P. Weightman,et al.  A rapid reflectance anisotropy spectrometer , 2001 .

[14]  Steven G. Louie,et al.  Ab initio calculation of the electronic and optical properties of solid pentacene , 2003 .

[15]  R. Cole,et al.  Azimuth-dependent reflection anisotropy spectroscopy , 2003 .

[16]  Antonello De Martino,et al.  Optimized Mueller polarimeter with liquid crystals. , 2003, Optics letters.

[17]  Antonello De Martino,et al.  Mueller polarimetric imaging system with liquid crystals. , 2004, Applied optics.

[18]  Andre K. Geim,et al.  Electric Field Effect in Atomically Thin Carbon Films , 2004, Science.

[19]  W. Richter,et al.  A fast reflectance anisotropy spectrometer for in situ growth monitoring , 2005 .

[20]  J. Keckes,et al.  Characterization of optical anisotropy in oriented poly(ethylene terephthalate) films using reflectance difference spectroscopy , 2006 .

[21]  Yang Yang,et al.  Patterning organic single-crystal transistor arrays , 2006, Nature.

[22]  H. Rotermund,et al.  Simple reflection anisotropy microscopy set-up for CO oxidation studies , 2007 .

[23]  Justin Shekwoga Baba,et al.  Wavelength, temperature, and voltage dependent calibration of a nematic liquid crystal multispectral polarization generating device. , 2007, Applied optics.

[24]  J. Pflaum,et al.  Kramers-Kronig-consistent optical functions of anisotropic crystals: generalized spectroscopic ellipsometry on pentacene. , 2008, Optics express.

[25]  David G. Voelz,et al.  Liquid crystal variable retarder modeling of incident angle response with experimental verification , 2008 .

[26]  T. Fritz,et al.  Optical differential reflectance spectroscopy of ultrathin epitaxial organic films. , 2009, Physical chemistry chemical physics : PCCP.

[27]  J. M. Flores-Camacho,et al.  A rotating-compensator based reflectance difference spectrometer for fast spectroscopic measurements. , 2010, The Review of scientific instruments.

[28]  D. Primetzhofer,et al.  Growth and optical properties of Ag clusters deposited on poly(ethylene terephthalate) , 2011, Nanotechnology.

[29]  N. Scrutton,et al.  Controlling the formation of a monolayer of cytochrome P450 reductase onto Au surfaces. , 2012, Physical review. E, Statistical, nonlinear, and soft matter physics.

[30]  O Núñez-Olvera,et al.  A rapid reflectance-difference spectrometer for real-time semiconductor growth monitoring with sub-second time resolution. , 2012, The Review of scientific instruments.

[31]  J. Nelson,et al.  Controlling microstructure of pentacene derivatives by solution processing: impact of structural anisotropy on optoelectronic properties. , 2013, ACS nano.

[32]  J. M. López-Téllez,et al.  Experimental method to characterize a liquid-crystal variable retarder and its application in a Stokes polarimeter. , 2013, Iberoamerican Meeting of Optics and the Latin American Meeting of Optics, Lasers and Their Applications.

[33]  Xiaotang Hu,et al.  Optimization for liquid crystal variable retarder-based spectroscopic polarization measurements. , 2014, Applied optics.

[34]  James C. Gladish,et al.  Alignment and temperature effects in liquid-crystal-based active polarimetry. , 2014, Applied optics.

[35]  Xiaotang Hu,et al.  A liquid crystal variable retarder-based reflectance difference spectrometer for fast, high precision spectroscopic measurements , 2014 .

[36]  Chongwu Zhou,et al.  Mechanical and Electrical Anisotropy of Few-Layer Black Phosphorus. , 2015, ACS nano.

[37]  L. F. Lastras-Martínez,et al.  A multichannel reflectance anisotropy spectrometer for epitaxial growth monitoring , 2015 .

[38]  Hua Zhang Ultrathin Two-Dimensional Nanomaterials. , 2015, ACS nano.

[39]  Xiaotang Hu,et al.  Optical and structural properties of the pentacene/quartz (0001) interface , 2016 .