Molybdenum–silicon aperiodic multilayer broadband polarizer for 13–30nm wavelength range
暂无分享,去创建一个
Jingtao Zhu | Philippe Jonnard | Nicola Mahne | Stefano Nannarone | A. Giglia | K. Le Guen | A. Giglia | S. Nannarone | P. Jonnard | K. Guen | N. Mahne | Jingtao Zhu | M. Tan | Lingyan Chen | Z. S. Wang | Lingyan Chen | M. Y. Tan | Z. S. Wang
[1] A. K. Powell,et al. Complete polarization analysis of extreme ultraviolet radiation with a broadband phase retarder and analyzer , 2007 .
[2] F. Salmassi,et al. Developments in realistic design for aperiodic Mo/Si multilayer mirrors. , 2006, Optics express.
[3] Cui Ming-qi,et al. Soft X-Ray Magneto-optical Faraday Effect around Ni M2,3 Edges , 2008 .
[4] J. Gautier,et al. Interface characteristics of Mo/Si and B4C/Mo/Si multilayers using non-destructive X-ray techniques , 2007 .
[5] Igor V. Kozhevnikov,et al. Design of X-ray supermirrors , 2001 .
[6] B. Doyle,et al. The BEAR Beamline at Elettra , 2004 .
[7] A. K. Powell,et al. Broadband multilayer polarizers for the extreme ultraviolet , 2006 .
[8] Jeffrey B. Kortright,et al. Tunable multilayer EUV/soft x‐ray polarimeter , 1995 .
[9] Masaki Yamamoto,et al. Performance of a wideband multilayer polarizer for soft x rays , 1992 .
[10] Franz Schäfers,et al. Broadband Mo∕Si multilayer transmission phase retarders for the extreme ultraviolet , 2007 .
[11] K Nguyen,et al. Tarnishing of Mo/Si multilayer x-ray mirrors. , 1993, Applied optics.
[12] A. K. Powell,et al. Broad angular multilayer analyzer for soft X-rays. , 2006, Optics express.
[13] T. Warwick,et al. Optics for element-resolved soft X-ray magneto-optical studies , 1999 .
[14] Franz Schäfers,et al. Short communication Broadband Mo/Si multilayer analyzers for the 15-17 nm wavelength range , 2006 .
[15] H. Grimmer,et al. Polarization analysis in soft X-ray diffraction to study magnetic and orbital ordering. , 2008, Journal of synchrotron radiation.
[16] Daniel G. Stearns,et al. X‐ray scattering from interfacial roughness in multilayer structures , 1992 .
[17] P. Jonnard,et al. X-ray interface analysis of aperiodic Mo/Si multilayers , 2007 .
[18] F. Schäfers,et al. Soft-x-ray polarimeter with multilayer optics: complete analysis of the polarization state of light. , 1999, Applied optics.