Molybdenum–silicon aperiodic multilayer broadband polarizer for 13–30nm wavelength range

Abstract Aperiodic molybdenum/silicon (Mo/Si) multilayer designed as a broadband polarizer with reflectivity over a wide wavelength range of 13–30 nm at a fixed incidence angle of 45° was developed by a numerical method. The multilayer was prepared using direct current magnetron sputtering. The reflectivity and polarizing properties were characterized using synchrotron radiation. In 13–30 nm wavelength region, the measured s -reflectivity ( R s ) with standard deviation is 13.5%±3.1%, p -reflectivity ( R p ) with standard deviation is 1.4%±0.5%. The mean of polarization degree is 81.2%. This broadband multilayer polarizer can be used in extreme ultraviolet polarization measurements, and will greatly simplify experimental arrangements.

[1]  A. K. Powell,et al.  Complete polarization analysis of extreme ultraviolet radiation with a broadband phase retarder and analyzer , 2007 .

[2]  F. Salmassi,et al.  Developments in realistic design for aperiodic Mo/Si multilayer mirrors. , 2006, Optics express.

[3]  Cui Ming-qi,et al.  Soft X-Ray Magneto-optical Faraday Effect around Ni M2,3 Edges , 2008 .

[4]  J. Gautier,et al.  Interface characteristics of Mo/Si and B4C/Mo/Si multilayers using non-destructive X-ray techniques , 2007 .

[5]  Igor V. Kozhevnikov,et al.  Design of X-ray supermirrors , 2001 .

[6]  B. Doyle,et al.  The BEAR Beamline at Elettra , 2004 .

[7]  A. K. Powell,et al.  Broadband multilayer polarizers for the extreme ultraviolet , 2006 .

[8]  Jeffrey B. Kortright,et al.  Tunable multilayer EUV/soft x‐ray polarimeter , 1995 .

[9]  Masaki Yamamoto,et al.  Performance of a wideband multilayer polarizer for soft x rays , 1992 .

[10]  Franz Schäfers,et al.  Broadband Mo∕Si multilayer transmission phase retarders for the extreme ultraviolet , 2007 .

[11]  K Nguyen,et al.  Tarnishing of Mo/Si multilayer x-ray mirrors. , 1993, Applied optics.

[12]  A. K. Powell,et al.  Broad angular multilayer analyzer for soft X-rays. , 2006, Optics express.

[13]  T. Warwick,et al.  Optics for element-resolved soft X-ray magneto-optical studies , 1999 .

[14]  Franz Schäfers,et al.  Short communication Broadband Mo/Si multilayer analyzers for the 15-17 nm wavelength range , 2006 .

[15]  H. Grimmer,et al.  Polarization analysis in soft X-ray diffraction to study magnetic and orbital ordering. , 2008, Journal of synchrotron radiation.

[16]  Daniel G. Stearns,et al.  X‐ray scattering from interfacial roughness in multilayer structures , 1992 .

[17]  P. Jonnard,et al.  X-ray interface analysis of aperiodic Mo/Si multilayers , 2007 .

[18]  F. Schäfers,et al.  Soft-x-ray polarimeter with multilayer optics: complete analysis of the polarization state of light. , 1999, Applied optics.