Structure and Growth of Chromophore-Functionalized (3-Aminopropyl)triethoxysilane Self-Assembled on Silicon

We have used X-ray reflectivity, ellipsometry, and X-ray photoelectron spectroscopy to characterize self-assembled films of (3-aminopropyl)triethoxysilane (APS) functionalized with a photosensitive chromophore. Using the evolution of film thickness with time devoted to initial APS adsorption on the surface, we obtain a model for the structure and growth dynamics of the film.