论文信息 - New Observations on the Uniaxial and Biaxial Strain-Induced Hot Carrier and NBTI Reliabilities for 65nm Node CMOS Devices and Beyond - 字舞流文

New Observations on the Uniaxial and Biaxial Strain-Induced Hot Carrier and NBTI Reliabilities for 65nm Node CMOS Devices and Beyond

Y. H. Lin | C. Tsai | S. Chung | D. Huang | Y. Tsai | C. S. Lai | P. W. Liu | C. Tsai | G. H. Ma | S. Chien | S. W. Sun