Wide-band characterization of multilayer thick film structures using a time-domain technique

A technique for modeling multilayer thick-film structures using time-domain measurements is presented. A multilayer inductor, formed by stacking spiral coils vertically with intervening dielectric layers, is used to demonstrate the technique. The component under test is placed at the end of a reference line, and a time-domain reflectometry (TDR) waveform is acquired. This TDR waveform is used to develop an equivalent network for the multilayer thick-film structure. The equivalent network model is then analyzed using conventional circuit analysis techniques to characterize the various electrical parameters (or properties) of the structure. >