IEEE International On-Line Testing Symposium

Issues related to on-line testing are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies which adversely impact noise margins, process, voltage and temperature variations, aging and wearout and make integrating on-line testing and fault tolerance mandatory in many modern ICs. The International On-Line Testing Symposium (IOLTS) is an established forum for presenting novel ideas and experimental data on these areas. The symposium also emphasizes on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in secure chips.

[1]  Enrique San Millán,et al.  Pseudo-random number generation applied to robust modern cryptography: A new technique for block ciphers , 2009, 2009 15th IEEE International On-Line Testing Symposium.

[2]  Pablo Maqueda,et al.  Analysis of the extra delay on interconnects caused by resistive opens and shorts , 2009, 2009 15th IEEE International On-Line Testing Symposium.

[3]  João Paulo Teixeira,et al.  Delay-fault tolerance to power supply Voltage disturbances analysis in nanometer technologies , 2009, 2009 15th IEEE International On-Line Testing Symposium.

[4]  Salvatore Pontarelli,et al.  Error detection in addition chain based ECC Point Multiplication , 2009, 2009 15th IEEE International On-Line Testing Symposium.

[5]  Paolo Bernardi,et al.  An I-IP based approach for the monitoring of NBTI effects in SoCs , 2009, 2009 15th IEEE International On-Line Testing Symposium.

[6]  Nacer-Eddine Zergainoh,et al.  Variability and reliability-aware application tasks scheduling and power control (Voltage and Frequency Scaling) in the future nanoscale multiprocessors system on chip , 2009, 2009 15th IEEE International On-Line Testing Symposium.