The DARPA Wide Band Gap Semiconductors for RF Applications (WBGS-RF) Program: Phase II Results
暂无分享,去创建一个
Mark J. Rosker | Christopher Bozada | Harry Dietrich | Alfred Hung | Dave Via | Steve Binari | Ed Vivierios | Eliot Cohen | Justin Hodiak | J. Hodiak | M. Rosker | S. Binari | C. Bozada | E. Cohen | D. Via | A. Hung | H. Dietrich | Ed Vivierios
[1] Seong-Yong Park,et al. TEM Observation of Crack- and Pit-Shaped Defects in Electrically Degraded GaN HEMTs , 2008, IEEE Electron Device Letters.
[2] Michael S. Shur,et al. Analytical HFET $I$ – $V$ Model in Presence of Current Collapse , 2008 .
[3] P. Rowell,et al. A study of output power stability of GaN HEMTs on SiC substrates , 2004, 2004 IEEE International Reliability Physics Symposium. Proceedings.