X‐ray microdiffractometer using synchrotron radiation

An x‐ray diffractometer using synchrotron radiation (SR) has been constructed and its performance was evaluated. Its characteristics are (1) a fine and highly intense x‐ray beam from focusing SR x rays on a sample using two spherical mirrors which are arranged in the Kirkpatrick–Baez configuration and (2) a high detection efficiency of the cylindrical bent imaging plate (IP). A focused beam size of 10×11 μm2 and intensity of more than 107 photons/s were obtained at a wavelength of 1.38 A. Accuracy of the lattice parameters, δa/a, was 2×10−4 estimated from measuring a superconductor YBa2Cu3O7−δ powder. The developed microdiffractometer was applied to measure diffraction images from a specific region on the NbTi metal superconducting wire which consisted of many NbTi fine wires buried in a Cu matrix. Diffraction peaks from a NbTi fine wire of 30 μm diameter were clearly observed and were distinct from the Cu matrix. The developed microdiffractometer can be applied to measurements of as‐received samples in t...