The mapping of outer-wall temperatures during the vertical test of a superconducting radio-frequency (SRF) cavity has been one of the most successful tools in studying the cavity loss mechanisms. However, due to the excessive number of sensors needed, no fixed-type temperature mapping (T-mapping) system that covers all cells has been built for 9-cell cavities. With the consensus that T-mapping analysis is needed in order to improve the yield of high-gradient cavities, a system with a reduced data acquisition time and increased temperature sensitivity, compared to rotating-arm systems, has been developed at LANL. The system consists of 4608 100ohm 1/8W Allen-Bradley resistors placed azimuthally every 10 degrees, a similar number of other resistors and diodes that implement the switching scheme, and data acquisition codes written in LabView. The details of the system and first results are presented and discussed.