论文信息 - SIMS Investigation of Ge Incorporation in 3C-SiC Layers Grown from Ge-Si Melts - 字舞流文

SIMS Investigation of Ge Incorporation in 3C-SiC Layers Grown from Ge-Si Melts

G. Ferro | Y. Monteil | J. Camassel | V. Souliere | N. Habka | M. Soueidan | H. Peyre