Distributed control and measurement system (DCS) preferable to design-for-testability (DfT) for analog ICs

A fast and efficient method for element-identification and Analog-DfT with the aid of ac Josephson voltages has been found from several papers listed in our references where specified terms Novel-Optimum-Identification (NOI) and Fast-Convergence-Identification (FCI) have been emphasized. Not only those issues in our DCS, the Controllability and Observability, but also the hazard-proof abilities vs the parasitic stray capacitive coupling anywhere especially inside each device in analog interface circuits have to be taken into consideration for our analog-DfT requirement. A computer program based on the method has been made and tested for its efficiency and capability.