Quantification of Bonded Ni Atoms for Ni-MoS2 Metallic Contact through X-ray Photoemission Electron Microscopy
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M. Huttula | W. Cao | Y. Niu | J. Hoszowska | Gang Wang | Xinying Shi | V. Pankratov | M. Alatalo | F. Zeeshan | J. Dousse | Sergei Posysaev | O. Miroshnichenko | A. Zakharov | Zhongjia Huang