Radiation Hardness Design and Test Verification of Program Configuration Module Based on Commercial Devices
暂无分享,去创建一个
Yi Sun | Hongwei Zhang | Min Tang | Qingkui Yu | Bo Mei | ZhiChao Wei
[1] C. Poivey,et al. Radiation Hardness Assurance for Space Systems , 2013 .
[2] Craig Ian Underwood,et al. Single event effects in commercial memory devices in the space radiation environment , 1996 .
[3] Xue Yu-xiong. Research on the single event latchup in the space and it's protechtion technology , 2007 .
[4] Dongwoo Lee,et al. A Novel Simulation Fault Injection Method for Dependability Analysis , 2009, IEEE Design & Test of Computers.