Identification of Surface Defects and Subsurface Dopants in a Delta-Doped System Using Simultaneous nc-AFM/STM and DFT
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P. Jelínek | Mykola Telychko | A. McLean | Z. Majzik | M. Švec | P. Mutombo | Evan J Spadafora | J. Berger
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P. Jelínek | Mykola Telychko | A. McLean | Z. Majzik | M. Švec | P. Mutombo | Evan J Spadafora | J. Berger