Erratum to "Reliability results of HBTs with an InGaP emitter" [Microelectron. Reliability 46 (2006) 1261-1271]

The author regrets that in the above article an error was made in the interpretation of the p-value. The statement, ‘‘In this context, a p-value is the probability of no difference’’. was incorrect. Here, a test statistic was formed from the estimates of two groups and their associated standard errors. The correct definition of a p-value for a test statistic is the probability of obtaining a statistic that is at least as extreme as the statistic actually observed, assuming there is no differ-