Dominant mechanisms of hot-carrier degradation in short- and long-channel transistors
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T. Grasser | B. Kaczer | J. Franco | M. Bina | J. M. Park | H. Enichlmair | S. Tyaginov | Y. Wimmer | H. Ceric | F. Rudolf | J.M. Park | Tibor Grasser | H. Ceric