Support vector machines for measuring dielectric properties of materials

Purpose – The dielectric properties of materials (complex permittivity) can be deduced from the admittance measured at the discontinuity plane of a coaxial open‐ended probe. This implies the implementation of an inversion procedure. The purpose of this paper is to develop a new non‐iterative inversion methodology in the field of microwave characterization allowing reducing the computation cost comparatively to iterative procedures.Design/methodology/approach – The inversion methodology combines the support vector machine (SVM) technique and the finite element method (FEM). The SVM are used as inverse models. They show good approximation and generalization capabilities. FEM allows the generation of the data sets required by the SVM parameter adjustment. A data set is constituted of input (complex admittance and frequency) and output (complex permittivity) pairs.Findings – The results show the applicability of SVM to solve microwave inverse problems instead of using traditional iterative inversion methods w...