A Novel Approach to Voltage-Drop Aware Placement in Large SoCs in Advanced Technology Nodes

High supply voltage drops in a circuit may lead to significant performance degradation and even malfunction in lower technology nodes like 45nm and below. Existing placement algorithms do not model voltage drops as an optimization objective and thus causes problems in power-integrity convergence. To remedy this deficiency, we propose a methodology to place the high power consumptions logic in lower IR (voltage) drop regions. We divide the whole floor plan into different buckets after doing an early voltage drop analysis, assuming virtual current sources in every 5u, at the lowest level metal on the PG grid. We propose to plug-in package, PCB parasitic and perform an early static and dynamic IR drop analysis by industry standard tools. The key efforts in this regard were logic clustering and region based placement. The placement regions are planned such that the high frequency logic blocks are placed in low IR drop buckets and low frequency logic blocks are placed in higher voltage drop regions. Our experimental results show 11 % improvement in peak voltage drop and 19% improvement in average voltage drop.

[1]  Ibrahim N. Hajj,et al.  Simulation and optimization of the power distribution network in VLSI circuits , 2000, IEEE/ACM International Conference on Computer Aided Design. ICCAD - 2000. IEEE/ACM Digest of Technical Papers (Cat. No.00CH37140).

[2]  Andrew T. Yang,et al.  Full-chip vectorless dynamic power integrity analysis and verification against 100uV/100ps-resolution measurement , 2004, Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571).

[3]  Ibrahim N. Hajj,et al.  Estimation of maximum current envelope for power bus analysis and design , 1998, ISPD '98.

[4]  Andrew B. Kahng,et al.  Supply voltage degradation aware analytical placement , 2005, 2005 International Conference on Computer Design.