The Introduction of New Products

SEM image of Cu TEG structure in a semiconductor The newly developed JIB-4600F MultiBeam System unites the unique imaging and analytical capabilities of the High Power Optics employed in the TFE SEM and a high-performance FIB column in a highly efficient and powerful system. Together with the advanced software developed at JEOL, the JIB-4600F offers an easy-to-use tool for highly automated sample preparation combined with high-resolution imaging and sub-micron analysis of the specimen cross-section. This tool will help to significantly reduce the time it takes to find the answer for various research and industrial applications requiring materials and defect analysis.