MIS slow-wave structures over a wide range of parameters

The authors study lossy multilayer, multiconductor microstrip structures using the spectral domain approach. The modal attenuation and propagation constants of these structures are given over an extremely wide range of substrate parameters and frequencies, covering all three regions: low loss, slow wave, and skin effect. The modal attenuation and propagation constants are presented for two and four conductor structures as a function of the substrate loss tangent. Single conductor structures are characterized with contour plots showing the complex effective dielectric constant as a function of both frequency and conductivity. >