Polarimetric investigations of residual stresses in Czochralski-grown LiNbO3 single crystals

In this work practical investigations of residual stresses in LiNbO3 crystals measured by the computer-controlled imaging polarimeter are compared with theoretical model developed for oxide crystalline materials. A good qualitative agreement has been found between theory and experiment regarding residual stress distributions in wafers cut out perpendicularly to the crystal's growth axis.