论文信息 - A 4Gbps 0.57pJ/bit Process-Voltage-Temperature Variation Tolerant All-Digital True Random Number Generator in 45nm CMOS

A 4Gbps 0.57pJ/bit Process-Voltage-Temperature Variation Tolerant All-Digital True Random Number Generator in 45nm CMOS

This paper describes an all-digital on-die true random number generator implemented in 45nm CMOS technology, with random bit throughput of 4Gbps and total energy consumption of 0.57pJ/bit. A 2-step tuning mechanism enables robust operation in the presence of up to 20% fabrication-time process variation as well as immunity to run-time voltage and temperature fluctuation. The 100% use of digital components enables a compact layout occupying 1024µm^2 with high entropy/bit of 0.94, and scalable operation down to 0.5V, while passing all NIST RNG tests.

Sanu Mathew | Ram Krishnamurthy | Vasantha Erraguntla | Suresh Srinivasan

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