Microwave characterization of integrated and multilayered directional couplers for wireless communication applications

A fast and accurate method characterizing embedded and coupled transmission lines is presented. Such multilayered structures are used to realize integrated directional couplers. The method requires simple two-ports network analyzer S-parameter measurements performed with a TRL calibration. Extractions of inductance and capacitance matrices are obtained in the [0.5-3.5] GHz frequency bandwidth. Comparisons with electromagnetic modeling results are given.