Design of porous silicon antireflection coatings for silicon solar cells

A porous silicon (PS) layer formed electrochemically in the outer part of the n emitter of p-n Si junctions can be used as an efficient antireflection coating (ARC). A two-step procedure is presented which can determine the electrochemical parameters leading to the formation of an optimized single-layer PS ARC. Single-layer PS ARCs achieving: 7% effective reflectance between 400 and 1000 nm are obtained on shallow p‐n junction solar cells. To reduce the reflectance further, the design of double-layer ARCs based on PS is investigated. PS layers with different porosities can be realized in a single experiment by modulating the current density during the electrochemical process. It is shown theoretically and experimentally that such PS structures can lead to an effective reflectance below 3%. © 2000 Elsevier Science S.A. All rights reserved.

[1]  K. Grigoras,et al.  The porous silicon emitter concept applied to multicrystalline silicon solar cells , 1997 .

[2]  R. Tenne,et al.  Efficiency and Stability Enhancement of n‐Si Photoelectrodes in Aqueous Solution , 1991 .

[3]  A. Goodman,et al.  Optical interference method for the approximate determination of refractive index and thickness of a transparent layer. , 1978, Applied optics.

[4]  O. S. Heavens,et al.  Optical Properties of Thin Solid Films , 2011 .

[5]  T. Lohner,et al.  Comparative study of the oxidation of thin porous silicon layers studied by reflectometry, spectroscopic ellipsometry and secondary ion mass spectroscopy , 1998 .

[6]  B. L. Sopori,et al.  Design of antireflection coatings for textured silicon solar cells , 1983 .

[7]  Claude Lévy-Clément,et al.  Optimization of porous silicon reflectance for silicon photovoltaic cells , 1999 .

[8]  C. Pickering,et al.  Optical properties of porous silicon films , 1985 .

[9]  G. C. Jain,et al.  Porous Silicon Oxide Anti‐Reflection Coating for Solar Cells , 1982 .

[10]  D. Aspnes,et al.  Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry , 1979 .

[11]  C. Lévy‐Clément,et al.  Formation and characterization of porous silicon layers for application in multicrystalline silicon solar cells , 1999 .

[12]  R. Jungerman,et al.  Broadband multilayer antireflection coating for semiconductor laser facets. , 1995, Optics letters.

[13]  J. Derrien,et al.  Porous Silicon Science and Technology , 1995 .

[14]  D. A. G. Bruggeman.  Berechnung verschiedener physikalischer Konstanten von heterogenen Substanzen. I. Dielektrizitätskonstanten und Leitfähigkeiten der Mischkörper aus isotropen Substanzen , 1935 .