Atom probe tomography at the University of Sydney

[1]  H. Andren,et al.  Atom‐probe field‐ion microscopy , 2007 .

[2]  J. D. Olson,et al.  Advances in Pulsed-Laser Atom Probe: Instrument and Specimen Design for Optimum Performance , 2007, Microscopy and Microanalysis.

[3]  Michael P Moody,et al.  New Techniques for the Analysis of Fine-Scaled Clustering Phenomena within Atom Probe Tomography (APT) Data , 2007, Microscopy and Microanalysis.

[4]  K. F. Russell,et al.  Atom probe specimen preparation with a dual beam SEM/FIB miller. , 2007, Ultramicroscopy.

[5]  H. Bernas,et al.  Some aspects of the silicon behaviour under femtosecond pulsed laser field evaporation. , 2007, Ultramicroscopy.

[6]  B. Gault,et al.  Optical and thermal processes involved in ultrafast laser pulse interaction with a field emitter. , 2007, Ultramicroscopy.

[7]  G. D. Smith,et al.  Aspects of the performance of a femtosecond laser-pulsed 3-dimensional atom probe. , 2007, Ultramicroscopy.

[8]  S. Ringer,et al.  Site-specific specimen preparation for atom probe tomography of grain boundaries , 2007 .

[9]  D. Seidman,et al.  Direct measurement of two-dimensional and three-dimensional interprecipitate distance distributions from atom-probe tomographic reconstructions , 2007, 0705.0052.

[10]  S. Ringer,et al.  Contingency table techniques for three dimensional atom probe tomography , 2007, Microscopy research and technique.

[11]  A. Hideur,et al.  Ultrafast ion emission from metallic tip excited by femtosecond laser pulses , 2006 .

[12]  G. Schmitz,et al.  New Tomographic Atom Probe at University of Muenster, Germany , 2006, 2006 19th International Vacuum Nanoelectronics Conference.

[13]  S. Ringer,et al.  Evolution of Nanostructure during the Early Stages of Ageing in Al-Zn-Mg-Cu Alloys , 2006 .

[14]  S. Ringer,et al.  Vacancy-Solute Interactions in Al-Cu-Mg , 2006 .

[15]  S. Ringer,et al.  Atom Probe Specimen Fabrication Methods using a Dual FIB/SEM , 2006, 2006 19th International Vacuum Nanoelectronics Conference.

[16]  S. Ringer Advanced Nanostructural Analysis of Aluminium Alloys Using Atom Probe Tomography , 2006 .

[17]  B. Gault,et al.  Evidence of field evaporation assisted by nonlinear optical rectification induced by ultrafast laser , 2006 .

[18]  B. Gault,et al.  Design of a femtosecond laser assisted tomographic atom probe , 2006 .

[19]  B. Gault,et al.  Estimation of the cooling times for a metallic tip under laser illumination , 2006 .

[20]  M. Dumont,et al.  Effects of Ag or Si on precipitation in the alloy Al-2.5 mass% Cu-1.5 mass% Mg , 2005 .

[21]  K. F. Russell,et al.  Strategies for fabricating atom probe specimens with a dual beam FIB. , 2005, Ultramicroscopy.

[22]  B. Deconihout,et al.  Design of a delay-line position-sensitive detector with improved performance , 2005 .

[23]  E. Pereloma,et al.  Ageing behaviour of an Fe–20Ni–1.8Mn–1.6Ti–0.59Al (wt%) maraging alloy: clustering, precipitation and hardening , 2004 .

[24]  E A Kenik,et al.  Atom Probe Tomography: A Technique for Nanoscale Characterization , 2004, Microscopy and Microanalysis.

[25]  J. D. Olson,et al.  First Data from a Commercial Local Electrode Atom Probe (LEAP) , 2004, Microscopy and Microanalysis.

[26]  F Vurpillot,et al.  A new step towards the lattice reconstruction in 3DAP. , 2003, Ultramicroscopy.

[27]  B. Deconihout,et al.  Design of a fast multi-hit position sensitive detector based on a CCD camera , 2002 .

[28]  Ottmar Jagutzki,et al.  Multiple hit read-out of a microchannel plate detector with a three-layer delay-line anode , 2001, 2001 IEEE Nuclear Science Symposium Conference Record (Cat. No.01CH37310).

[29]  G. D. Smith,et al.  Measurements of field enhancement introduced by a local electrode. , 2001, Ultramicroscopy.

[30]  S. Ringer,et al.  Effects of Cu on Precipitation in Al-Zn-Mg Alloys , 2000 .

[31]  J. Güdde,et al.  Electron and lattice dynamics following optical excitation of metals , 2000 .

[32]  M. Blamire,et al.  Field-ion specimen preparation using focused ion-beam milling , 1999 .

[33]  David J. Larson,et al.  Local Electrode Atom Probes , 1998, Microscopy and Microanalysis.

[34]  Simon P. Ringer,et al.  Origins of hardening in aged AlGuMg(Ag) alloys , 1997 .

[35]  Michael K Miller,et al.  Atom Probe Field Ion Microscopy , 1996 .

[36]  Alfred Cerezo,et al.  Improvements in the mass resolution of the three-dimensional atom probe , 1996 .

[37]  D. Larson,et al.  On the many advantages of local-electrode atom probes. , 1996, Ultramicroscopy.

[38]  G. Smith,et al.  Improvements in three-dimensional atom probe design , 1994 .

[39]  O. Nishikawa,et al.  Toward a scanning atom probe — computer simulation of electric field - , 1994 .

[40]  D. Blavette,et al.  The tomographic atom probe: A quantitative three‐dimensional nanoanalytical instrument on an atomic scale , 1993 .

[41]  D. Blavette,et al.  An atom probe for three-dimensional tomography , 1993, Nature.

[42]  G. Smith,et al.  New dimensions in atom probe analysis , 1992 .

[43]  Liu,et al.  Kinetic-energy and mass analysis of carbon cluster ions in pulsed-laser-stimulated field evaporation. , 1988, Physical review. B, Condensed matter.

[44]  Alfred Cerezo,et al.  Application of a position-sensitive detector to atom probe microanalysis , 1988 .

[45]  T. Hashizume,et al.  Atom‐probe investigation of III–V semiconductors: Comparison of voltage‐pulse and laser‐pulse modes , 1986 .

[46]  H. M. Liu,et al.  Numerical calculation of the temperature distribution and evolution of the field-ion emitter under pulsed and continuous-wave laser irradiation , 1986 .

[47]  G. Smith,et al.  Pulsed laser atom probe analysis of GaAs and InAs , 1985 .

[48]  James G. Fujimoto,et al.  Femtosecond Laser Interaction with Metallic Tungsten and Nonequilibrium Electron and Lattice Temperatures , 1984, Topical Meeting on Ultrafast Phenomena.

[49]  T. Tsong,et al.  Numerical calculation of the temperature evolution and profile of the field ion emitter in the pulsed‐laser time‐of‐flight atom probe , 1984 .

[50]  G. Kellogg Measurement of activation energies for field evaporation of tungsten ions as a function of electric field , 1984 .

[51]  T. Tsong,et al.  Energy distributions of pulsed-laser field-desorbed gaseous ions and field-evaporated metal ions: A direct time-of-flight measurement , 1984 .

[52]  G. Kellogg Field evaporation of silicon and field desorption of hydrogen from silicon surfaces , 1983 .

[53]  T. Tsong,et al.  Pulsed-laser stimulated field desorption of gas molecules and field evaporation of metal atoms , 1983 .

[54]  T. Tsong,et al.  Pulsed‐laser time‐of‐flight atom‐probe field ion microscope , 1982 .

[55]  G. Kellogg Determining the field emitter temperature during laser irradiation in the pulsed laser atom probe , 1981 .

[56]  G. Kellogg,et al.  Pulsed-laser atom-probe field-ion microscopy , 1980 .

[57]  John Bibby,et al.  The Analysis of Contingency Tables , 1978 .

[58]  E. Müller,et al.  Field calibration using the energy distribution of a free‐space field ionization , 1977 .

[59]  T. Tsong,et al.  Photon stimulated field ionization , 1976 .

[60]  A. Melmed,et al.  Field ion microscopy of silicon , 1975 .

[61]  E. Müller,et al.  Energy deficits in pulsed field evaporation and deficit compensated atom‐probe designs , 1974 .

[62]  E. Müller,et al.  Field calibration using the energy distribution of field ionization , 1973 .

[63]  T. Tsong Measurement of the Polarizabilities and Field Evaporation Rates of Individual Tungsten Atoms , 1971 .

[64]  E. Müller,et al.  Effects of Static-Field Penetration and Atomic Polarization on the Capacity of a Capacitor, Field Evaporation, and Field Ionization Processes , 1969 .

[65]  J. W. Gahn Hardening by spinodal decomposition , 1963 .

[66]  E. Müller,et al.  FIELD IONIZATION OF GASES AT A METAL SURFACE AND THE RESOLUTION OF THE FIELD ION MICROSCOPE , 1956 .