Parallel atomic force microscopy using optical heterodyne detection
暂无分享,去创建一个
Myun-Sik Kim | Kenneth J. Weible | Urs Staufer | Hans Peter Herzig | Peter Vettiger | René Dändliker | O. Manzardo | Laura Chantada | L. Aeschimann | H. Herzig | P. Vettiger | R. Dändliker | K. Weible | U. Staufer | L. Chantada | L. Aeschimann | Myun-Sik Kim | Omar Manzardo
[1] Bart W. Hoogenboom,et al. A Fabry-Perot interferometer for micrometer-sized cantilevers , 2005 .
[2] D. Marshall,et al. Review of progress in quantitative non-destructive evaluation: edited by D. O. Thompson and D. E. Chimenti; published by Plenum, New York, 1983; 1853 pp.; price, U.S. $225.00 , 1985 .
[3] H. Herzig,et al. Atomic force microscopy with optical heterodyne detection method , 2005, IEEE/LEOS International Conference on Optical MEMS and Their Applications Conference, 2005..
[4] Gerber,et al. Atomic force microscope. , 1986, Physical review letters.
[5] N. Amer,et al. Novel optical approach to atomic force microscopy , 1988 .
[6] Hemantha K. Wickramasinghe,et al. Atomic force microscope–force mapping and profiling on a sub 100‐Å scale , 1987 .
[7] D. Rugar,et al. Atomic emission from a gold scanning-tunneling-microscope tip. , 1990, Physical review letters.
[8] René Dändliker,et al. Distance measurement by multiple-wavelength interferometry , 1998 .
[9] H. Kikuta,et al. Atomic force microscope using optical heterodyne detection incorporated in an optical microscope , 1995 .