Resistive FET mixer conversion loss and IMD optimization by selective drain bias

This paper describes a dedicated nonlinear MESFET model extraction technique, which was used to accurately characterize the device's channel resistance nonlinearity. Plotting Ids(Vgs,Vds) Taylor series expansion coefficients across V/sub GS/ and V/sub DS/ revealed not only the presence of important minimum conversion loss bias, but also of in-band IMD sweet spots that were then used to optimize a FET resistive mixer performance.

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