Low frequency noise characterization of very large value resistors

A very simple circuit configuration is described which allows to characterize the noise of very large value resistors. With this measurement setup we investigated the low frequency noise of large value resistors, tens of G/spl Omega/ range, realized with different technologies, at different bias voltages. A technique is suggested that allows to reduce the low frequency noise contribution, by optimizing the connecting arrangement. A short review of the resistor noise theory is given.

[1]  G. Pessina,et al.  A very simple method to measure the input capacitance and the input current of transistors , 2001 .

[2]  Ezio Previtali,et al.  New experimental results on double beta decay of 130Te , 2000 .

[3]  E. Fiorini,et al.  Present status of MI-BETA cryogenic experiment and preliminary results for CUORICINO , 2000 .

[4]  R. Howard.  Ultralow noise high gain transimpedance amplifier for characterizing the low frequency noise of infrared detectors , 1999 .

[5]  F. Hooge.  1/f noise sources , 1994 .

[6]  C. Hu,et al.  A unified model for the flicker noise in metal-oxide-semiconductor field-effect transistors , 1990 .

[7]  R. Howard,et al.  On the noise of high-transimpedance amplifiers for long-wavelength pulse OTDRs , 1987 .

[8]  L.K.J. Vandamme,et al.  1/f noise measurements for characterizing multispot low‐Ohmic contacts , 1976 .

[9]  John Clarke,et al.  Flicker (1f) noise: Equilibrium temperature and resistance fluctuations , 1976 .

[10]  L. Vandamme.  1/f noise of point contacts affected by uniform films , 1974 .

[11]  R. Voss,et al.  1 f Noise from Thermal Fluctuations in Metal Films , 1974 .

[12]  F. Hooge.  Discussion of recent experiments on 1/ƒ noise , 1972 .

[13]  F. Hooge.  1/ƒ noise is no surface effect , 1969 .

[14]  J. Williams,et al.  Current noise in thin gold films , 1969 .

[15]  A. van der Ziel,et al.  Flicker Noise in Electronic Devices , 1979 .

[16]  R. Jones,et al.  The General Theory of Bolometer Performance , 1953 .