论文信息 - Total dose dependence of soft-error hardness in 64 kbit SRAMs evaluated by single-ion microprobe technique - 字舞流文

Total dose dependence of soft-error hardness in 64 kbit SRAMs evaluated by single-ion microprobe technique

T. Matsukawa | I. Ohdomari | S. Matsuda | M. Koh | S. Kuboyama | T. Tanii | K. Hara | K. Horita | A. Kishida | B. Shigeta | M. Goto