A systematic study of trade-offs in engineering a locally strained pMOSFET
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R. Rooyackers | I. De Wolf | F. Nouri | G. Eneman | M. Shen | S. Biesemans | M. Jurczak | K. De Meyer | P. Verheyen | V. Moroz | R. Schreutelkamp | D. Pramanik | H. Forstner | M. Jurczak | Y. Kim | V. Moroz | R. Rooyackers | L. Washington | F. Nouri | S. Thirupapuliyur | G. Eneman | P. Verheyen | L. Smith | M. Kawaguchi | R. Schreutelkamp | I. De Wolf | D. Pramanik | X. Xu | K. De Meyer | S. Biesemans | M. Shen | G. Higashi | L. Smith | L. Washington | M. Kawaguchi | Y. Kim | X. Xu | S. Thirupapuliyur | G.S. Higashi | H. Forstner
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