论文信息 - High resolution XPS studies of Se chemistry of a Cu(In, Ga)Se2 surface

High resolution XPS studies of Se chemistry of a Cu(In, Ga)Se2 surface

Chemistry of co-evaporated Cu(In, Ga)Se2 (CIGS) surfaces submitted or not to chemical treatments was investigated by high resolution XPS. The surface analysis allowed us to compare the surface composition with the bulk one as a function of the treatments. We also studied too several standard compounds as Cu2−xSe, In2Se3, ZnSe, Se0 and CdSe. A Se XPS signal specific of the CIGS surfaces was identified. In this paper, we present a detailed study of Se signal in CIGS and show of the different spectroscopic contributions can be separated using standards information. Then, we discuss the chemical origin of these signals and the implications for the device processing.

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