Cutting edge sharpness measurement using angle limited total integrated scattering

This paper describes a new method for measuring the cutting edge sharpness by using angle limited total integrated scattering (ALTIS). Using this method, the radius of the cutting edges can be measured directly and assessed in numerical quantities. Hypothesizing that the normal cutting edges possess the elliptical profile, the relationship between the radius and the scattered light from the cutting edge is analyzed. Using the diode laser, three metal cutting tools are measured experimentally and the results are compared with those obtained from SEM.<<ETX>>