Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions
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Stephen LaLumondiere | R. Koga | Steven C. Moss | K. B. Crawford | S. H. Penzin | W. R. Crain | M. C. Maher | S. D. Pinkerton | R. Koga | S. Moss | S. Lalumondiere | M. Maher | K. Crawford | S. Penzin | W. Crain
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