The Mean and Median Criteria for Kernel Bandwidth Selection for Support Vector Data Description
暂无分享,去创建一个
Deovrat Kakde | Arin Chaudhuri | Laura Gonzalez | Carol Sadek | Seunghyun Kong | A. Chaudhuri | Seunghyun Kong | Carol Sadek | Deovrat Kakde | L. Gonzalez
[1] Jorge Silva,et al. Peak criterion for choosing Gaussian kernel bandwidth in Support Vector Data Description , 2017, 2017 IEEE International Conference on Prognostics and Health Management (ICPHM).
[2] Deovrat Kakde,et al. Kernel bandwidth selection for SVDD: The sampling peak criterion method for large data , 2017, 2017 IEEE International Conference on Big Data (Big Data).
[3] Ratna Babu Chinnam,et al. General support vector representation machine for one-class classification of non-stationary classes , 2008, Pattern Recognit..
[4] Bernhard Schölkopf,et al. Support Vector Method for Novelty Detection , 1999, NIPS.
[5] Giles M. Foody,et al. Sanchez-Hernandez, Carolina and Boyd, Doreen S. and Foody, Giles M. (2007) One-class classification for monitoring a specific land cover class: SVDD classification of fenland. IEEE Transactions on , 2016 .
[6] Shehroz S. Khan,et al. A Survey of Recent Trends in One Class Classification , 2009, AICS.
[7] Robert P. W. Duin,et al. Robust machine fault detection with independent component analysis and support vector data description , 1999, Neural Networks for Signal Processing IX: Proceedings of the 1999 IEEE Signal Processing Society Workshop (Cat. No.98TH8468).
[8] Charu C. Aggarwal,et al. Outlier Analysis , 2013, Springer New York.
[9] A. Asuncion,et al. UCI Machine Learning Repository, University of California, Irvine, School of Information and Computer Sciences , 2007 .
[10] Robert P. W. Duin,et al. Support Vector Data Description , 2004, Machine Learning.
[11] P. Ho. Geoscience And Remote Sensing , 2014 .
[12] Seoung Bum Kim,et al. One-class classification-based control charts for multivariate process monitoring , 2009 .
[13] Bo-Suk Yang,et al. Support vector machine in machine condition monitoring and fault diagnosis , 2007 .
[14] Barry M. Wise,et al. A comparison of principal component analysis, multiway principal component analysis, trilinear decomposition and parallel factor analysis for fault detection in a semiconductor etch process , 1999 .