On the experimental determination of channel back-scattering in nanoMOSFETs
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D. Esseni | P. Palestri | L. Selmi | M. Zilli
[1] M. Shur,et al. Low ballistic mobility in submicron HEMTs , 2002, IEEE Electron Device Letters.
[2] L. Selmi,et al. Understanding quasi-ballistic transport in nano-MOSFETs: part I-scattering in the channel and in the drain , 2005, IEEE Transactions on Electron Devices.
[3] S. Takagi,et al. On the universality of inversion layer mobility in Si MOSFET's: Part I-effects of substrate impurity concentration , 1994 .
[4] Mark S. Lundstrom. Elementary scattering theory of the Si MOSFET , 1997, IEEE Electron Device Letters.
[5] D. Antoniadis,et al. On experimental determination of carrier velocity in deeply scaled NMOS: how close to the thermal limit? , 2001, IEEE Electron Device Letters.
[6] M. Lundstrom,et al. Essential physics of carrier transport in nanoscale MOSFETs , 2002 .
[7] C.H. Diaz,et al. Separation of channel backscattering coefficients in nanoscale MOSFETs , 2004, IEEE Transactions on Electron Devices.
[8] Ming-Jer Chen,et al. Temperature-Oriented Experiment and Simulation as Corroborating Evidence of MOSFET Backscattering Theory , 2007, IEEE Electron Device Letters.