Comparison of Electronic Component Durability Under Uniaxial and Multiaxial Random Vibrations
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Mark E. Robeson | Michael F. Pohland | Mark E Robeson | E. Habtour | A. Dasgupta | M. Paulus | M. Ernst
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Mark E. Robeson | Michael F. Pohland | Mark E Robeson | E. Habtour | A. Dasgupta | M. Paulus | M. Ernst