Time-Frequency Domain Reflectometry Apparatus and Methods

PURPOSE: An apparatus and a method for processing a reflective wave signal of a time-frequency domain are provided to analyze the reflective wave signal by using a time-frequency analysis method. CONSTITUTION: An apparatus for processing a reflective wave of a time-frequency domain includes a PC(100), a digital signal processor(200), an arbitrary waveform generator(300), and a data acquisition instrument(400). The PC(100) is formed with a control program(110), a time-frequency domain analysis control program(120), and a processor control program(130). The digital signal processor(200) is used for detecting a defect and a position of the defect by comparing a signal of the PC(100) with data of an oscilloscope or analyzing the data by performing an internal calculation. The arbitrary waveform generator(300) is used for generating a predetermined input signal to a conductive wire(600). The data acquisition instrument(400) is used for storing data values of reflective wave signals of the conductive wire(600) as two vectors for indicating a time value and a voltage value.