论文信息 - Cryogenic Operation of Thin-Film FDSOI nMOS Transistors: The Effect of Back Bias on Drain Current and Transconductance - 字舞流文

Cryogenic Operation of Thin-Film FDSOI nMOS Transistors: The Effect of Back Bias on Drain Current and Transconductance

G. Ghibaudo | M. Cassé | M. Vinet | S. Barraud | T. Poiroux | B. C. Paz | T. Meunier | S. de Franceschi | F. Gaillard