Measurement and Compact Modeling of 1/f Noise in HV-MOSFETs
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E. Seebacher | T. Gneiting | A. Bazigos | F. Krummenacher | M. Bucher | N. Mavredakis | J. Sallese | R. Friedrich | W. Pflanzl | F. Krummenacher | J. Sallese | M. Bucher | A. Bazigos | E. Seebacher | T. Gneiting | N. Mavredakis | W. Pflanzl | R. Friedrich
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