论文信息 - Conditions for the coincidence of the TFR, TRV and CE models

Conditions for the coincidence of the TFR, TRV and CE models

Bhattacharyya and Soejoeti (1989) put forward the tampered failure rate model (TFR Model) for step-stress Accelerated Life Tests(ALT). This paper studies the conditions for the coincidence of the TRV, TFR and CE models, gives the definitions of the coincidence, offers a proof of the necessary and sufficient condition for the coincidence of the TRV and TFR models in [1], and points out a mistake that appeared in the counterexample provided in [3].

Ronghua Wang | Heliang Fei

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[6] G. K. Bhattacharyya,et al. A tampered failure rate model for step-stress accelerated life test , 1989 .