论文信息 - XPS depth profiling of organic photodetectors with the gas cluster ion beam - 字舞流文

XPS depth profiling of organic photodetectors with the gas cluster ion beam

J. Haberko | D. Djurado | J. Faure-Vincent | A. Bernasik | W. Łużny | M. Marzec | Alexandre Pereira | A. Revaux | P. Lienhard