Sequential monitoring of surface spatial variation in automotive machining processes based on high definition metrology

Abstract The ability to monitor machining processes within micron level is critical to high precision manufacturing. New non-contact measurement technology, such as holography based high definition metrology (HDM), makes this feasible through monitoring of both the part shape and its surface texture. However, conventional statistical process monitoring and diagnostic schemes based on low definition measurement technology have limitations in addressing the HDM data since such data are in high-dimensional form and may show strong spatial correlation. Based on a previously published sequential strategy for global and localized monitoring of shape variations in HDM data, this paper improves the method by refining the localized monitoring scheme, and applies the method to HDM data collected from an automotive engine head machining process. The results show that the proposed HDM monitoring scheme can effectively localize the defective regions on the out-of-control parts.

[1]  Qiang Huang,et al.  Error cancellation modeling and its application to machining process control , 2006 .

[2]  L. Mark Berliner,et al.  Combining Information Across Spatial Scales , 2005, Technometrics.

[3]  Darek Ceglarek,et al.  Fixture Failure Diagnosis for Autobody Assembly Using Pattern Recognition , 1996 .

[4]  Daniel W. Apley,et al.  Diagnosis of Multiple Fixture Faults in Panel Assembly , 1996, Manufacturing Science and Engineering.

[5]  Yu Wang,et al.  Manufactured Part Modeling for Characterization of Geometric Variations of Automotive Spaceframe Extrusions , 1998 .

[6]  Noel A Cressie,et al.  Statistics for Spatial Data. , 1992 .

[7]  Faryar Etesami,et al.  Tolerance verification through manufactured part modeling , 1988 .

[8]  Daniel W. Apley,et al.  Identifying and visualizing nonlinear variation patterns in multivariate manufacturing data , 2007 .

[9]  Hassan Zahouani,et al.  Identification of manufacturing signature by 2D wavelet decomposition , 2008 .

[10]  Di Chen,et al.  Wavelet-Based Data Reduction Techniques for Process Fault Detection , 2006, Technometrics.

[11]  Qiang Du,et al.  Convergence of the Lloyd Algorithm for Computing Centroidal Voronoi Tessellations , 2006, SIAM J. Numer. Anal..

[12]  Richard A. Johnson,et al.  Applied Multivariate Statistical Analysis , 1983 .

[13]  Jyhwen Wang,et al.  Gaussian process method for form error assessment using coordinate measurements , 2008 .

[14]  S. P. Lloyd,et al.  Least squares quantization in PCM , 1982, IEEE Trans. Inf. Theory.

[15]  Yu Ding,et al.  Bayesian hierarchical model for combining misaligned two-resolution metrology data , 2011 .

[16]  C. Deutsch,et al.  Teacher's Aide Variogram Interpretation and Modeling , 2001 .

[17]  S. Jack Hu,et al.  High-Definition Metrology Based Spatial Variation Pattern Analysis for Machining Process Monitoring and Diagnosis , 2009 .