Principles of testing electronic systems

DESIGN AND TEST. Overview of Testing. Defects, Failures, and Faults. Design Representation. VLSI Design Flow. TEST FLOW. Role of Simulation in Testing. Automatic Test Pattern Generation. Current Testing. DESIGN FOR TESTABILITY. Ad Hoc Test Techniques. Scan-Path Design. Boundary-Scan Testing. Built-in Self-Test. SPECIAL STRUCTURES. Memory Testing. Testing FPGAs and Microprocessors. ADVANCED TOPICS. Synthesis for Testability. Testing SOCs. Appendices. Index.