A test object for calibration and accuracy assessment in X-ray CT metrology
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Jean-Pierre Kruth | Tan Ye | André Voet | Philip Bleys | Frank Welkenhuyzen | Ye Tan | Wim Dewulf | Kim Kiekens | Dewulf Wim | Welkenhuyzen Frank | Bleys Philip | Voet André | Kruth Jean-Pierre | Kiekens Kim
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