Estimating the half-lives of PCB congeners in former capacitor workers measured over a 28-year interval
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D. Jennings | J. Seibyl | S. Factor | K. Marek | A. Todd | R. Haase | E. Molho | P. Parsons | M. Wolff | E. Fitzgerald | R. Mccaffrey | D. Higgins | R. Seegal | E. Hills