Test selection based on high level fault simulation for mixed-signal systems
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[1] Mark Zwolinski,et al. Relaxation methods for analogue fault simulation , 1995, Proceedings of International Conference on Microelectronics.
[2] A. Householder. A Survey of Some Closed Methods for Inverting Matrices , 1957 .
[3] Jacob A. Abraham,et al. Hierarchical fault modeling for analog and mixed-signal circuits , 1992, Digest of Papers. 1992 IEEE VLSI Test Symposium.
[4] Prashant Goteti,et al. Hierarchy based statistical fault simulation of mixed-signal ICs , 1996, Proceedings International Test Conference 1996. Test and Design Validity.
[5] Bozena Kaminska,et al. FaultMaxx: A Perturbation Based Fault Modeling and Simulation for Mixed-Signal Circuits , 2001 .
[6] C.-J. Richard Shi,et al. Rapid frequency-domain analog fault simulation under parameter tolerances , 1997, DAC.
[7] M. Soma,et al. Challenges in analog and mixed-signal fault models , 1996 .
[8] Stephen K. Sunter,et al. Test metrics for analog parametric faults , 1999, Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146).
[9] H. F. Spence. Automatic analog fault simulation , 1996, Conference Record. AUTOTESTCON '96.
[10] Kwang-Ting Cheng,et al. Specification back-propagation and its application to DC fault simulation for analog/mixed-signal circuits , 1999, Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146).