论文信息 - Surface characterization of as-grown CeO2 cap layer morphology evolution and critical current density of post-deposited YBCO films - 字舞流文

Surface characterization of as-grown CeO2 cap layer morphology evolution and critical current density of post-deposited YBCO films

T. Qu | F. Feng | Z. Han | K. Shi | S. Xiao | R. Huang | Y. Zhu | Y. Y. Zhang | H. Y. Lu | Z. Hou