On-chip rom test apparatus and method thereof

PURPOSE: An on-chip ROM test apparatus and a method thereof are provided to test the on-chip ROM in the inside of the chip without dumping the content of the on-chip ROM to the outside of the chip. CONSTITUTION: According to the on-chip ROM test apparatus(100) testing a ROM(50) in a semiconductor chip in the inside of the semiconductor chip, a test control signal generator(10) generates a test mode signal making the ROM be a test mode, and a test clock signal for generating a clock required in the test of the ROM, and a ROM clock signal to operate the ROM using a test signal applied from the external including a test reset signal for initialization and test control signals including a ROM address to access the ROM, and then applies them to the ROM. A comparator(20) compares ROM data read from the ROM with reference data applied from the external in response to the ROM address. And a test result accumulator(30) stores error generation as a test result by referring to the comparison result from the comparator, and outputs the test result if ROM data comparison to the last ROM address is completed.